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Scanning blue laser microscope for strength measurement of thin films at high temperatures
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FE-SEM (Field Emission Type Scanning Electron Microscope)
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AFM (Atomic Force Microscope)
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X-Ray Microbeam Diffractmeter
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Ion Chromatography System
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SSRT-CER (Slow Strain Rate Test Contact Electric Resistance)
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Low-Pressure Type Cold Spray System
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Material Testing System
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SP (Small-Punch) Creep Testing System
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High-Pressure Type Cold Spray System
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Electromagnetic Force Micro Material Tester
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System Safety Benchmark Facility
* Click to enlarge image